Zhi Wang

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Organization: Beijing Institute of Technology
Department: Key Laboratory of Cluster Science, Ministry of Education of China
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Co-reporter:Lin-ao Zhang;Hao-nan Liu;Xiao-xia Suo;Shou Tong
Journal of Materials Science 2017 Volume 52( Issue 11) pp:6442-6448
Publication Date(Web):09 February 2017
DOI:10.1007/s10853-017-0879-y
Titanium nitride is regarded as an alternative plasmonic material for its tunability and other high performances. In this work, we prepared \(\hbox {TiN}_{x}\) thin films by ion beam assisted deposition and studied the effects of assisting ion energy \(E_\mathrm{a}\) on the structural, electrical, optical, and plasmonic properties of the films. The results show that the bombardment of assisting ions causes higher crystallinity and higher resistivity. Both the experimental and fitting results show that assisting ions can improve the plasmonic performance of \(\hbox {TiN}_{x}\) thin films. Higher \(E_\mathrm{a}\) leads to lower carrier concentration, lower plasma frequency, and lower optical losses. With \(E_\mathrm{a}\) increasing, the energy loss function shifts toward low photon energy. Importantly, IBAD–\(\hbox {TiN}_{x}\) can serve as a promising plasmonic material in visible and near-IR region, and its plasmonic properties can be effectively tuned by assisting ions energy.
Co-reporter:Huiping Lu, Peipei Zhou, Haonan Liu, Linao Zhang, Yang Yu, Yinglan Li, Zhi Wang
Materials Letters 2016 Volume 165() pp:123-126
Publication Date(Web):15 February 2016
DOI:10.1016/j.matlet.2015.11.105
Highlights•ZnO:Nfilms were prepared with/without O2 pressure.•Microstructure, morphology, and optical properties of the films were investigated.•Different defects influence the structure and optical behavior of the films.•Band-gap is narrowed by increasing nitrogen substitute and oxygen vacancies.•N substitute, not N interstitial, is an effective factor narrowing band gap.Nitrogen doped ZnO films were prepared by magnetron sputtering. We studied the influence of nitrogen partial pressure pn and oxygen partial pressure po on the microstructure, morphology and optical properties of the thin films. The results show that different defects influence the structure and optical behavior of the films. Doping-related tensile stress turns compressive, owing to a different N-doping form in the films. Red-shift of absorption edge was observed with increasing pn and decreasing po. Band-gap narrowing is improved by increasing nitrogen substitute and oxygen vacancies.
Co-reporter:Linao Zhang, Shuo Tong, Haonan Liu, Yinglan Li, Zhi Wang
Materials Letters 2016 Volume 171() pp:304-307
Publication Date(Web):15 May 2016
DOI:10.1016/j.matlet.2016.02.100
Highlights•TiN thin films on glass substrates were prepared by ion-beam-deposition.•Effects of sputtering ion and assisting ion energy on the orientation were analyzed.•High assisting ions and assisting ion current could enhance the crystallinity.•Too high assisting ion energy and current can destroy the crystallinity•The results can be attributed to the energy exchange between assisting ions and adatoms.Ion beam assisted titanium nitride (TiN) film has attracted much attention because its fast texture and high conductivity can be effectively applied in all-conductive superconducting coated conductor. In this work, TiN films were prepared by ion beam sputtering deposition from a metal titanium target. Effects of sputtering ion energy, assisting ion energy, assisting ion current and deposition temperature on the orientation and surface morphology were analyzed. The results indicate that assisting ion is an important factor in orientation selection, and high assisting ions and low assisting ion current could enhance the crystallinity. However, too high assisting ion energy and current can destroy the crystallinity in IBAD–TiN. This orientation selection can be attributed to the energy exchange between assisting ions and adatoms.
Co-reporter:Lin-Ao Zhang, Hao-Nan Liu, Xiao-Xia Suo, Shuo Tong, Ying-Lan Li, Zhao-Tan Jiang, Zhi Wang
Materials Letters 2016 Volume 185() pp:295-298
Publication Date(Web):15 December 2016
DOI:10.1016/j.matlet.2016.08.147
Highlights•The plasmonic properties of IBAD-TiNx films can be tuned by N2 partial pressure pn and deposition temperature Td.•Lower pn and higher Td can enhance the plasma frequency.•The optical loss of the samples is influenced little by pn, but reduced obviously by higher Td.•The plasmon resonance is reduced by higher pn and lower Td.Titanium nitride (TiNx) is regarded as a kind of promising plasmonic material for its high performances. We studied the influence of nitrogen partial pressure pn and deposition temperature Td on the structural and plasmonic properties of the TiNx thin films prepared by ion beam assisted deposition (IBAD). The results show that IBAD is an effective method to tailor the plasmonic properties of TiNx films in visible and near-IR region. The plasmonic properties of the films have significant Td and pn dependence. Higher pn and lower Td can reduce the plasma frequency and the plasmon resonance. Higher pn and higher Td can reduce the optical loss of the samples. The modification of the plasmonic properties is related to the variation of nitrogen content.
Co-reporter:Peipei Zhou;Haonan Liu;Linao Zhang
Journal of Materials Science: Materials in Electronics 2016 Volume 27( Issue 8) pp:7822-7828
Publication Date(Web):2016 August
DOI:10.1007/s10854-016-4771-3
Undoped and Cu-doped ZnO (ZnO:Cu) thin films were prepared using magnetron co-sputtering. Effects of substrate temperature \(T_{s}\) on their structural, electrical and optical properties were comparatively investigated using X-ray diffraction, atom force microscopy, and ultraviolet visible spectrophotometer. ZnO:Cu thin films with different doping content were prepared and studied in order to investigate the effects of Cu-doping content. The results show that all the films exhibit a single phase (002)-oriented hexagonal wurtzite structure. Higher \(T_{s}\) enhances the crystallinity and reduces the compressive stress of the films. Cu-doping and increasing \(T_{s}\) lead to rougher surface and larger granules. The resistivity of both the ZnO and ZnO:Cu films increases with \(T_{s}\). Interestingly, optical band gap \(E_{g}\) of ZnO:Cu films increases significantly with \(T_{s}\), while \(E_{g}\) of undoped film is not obviously influenced by \(T_{s}\). Cu-doping content is an important factor affecting the physical properties of ZnO:Cu thin films. In our experiments, Cu-doping composition sightly decreases with \(T_{s}\) increasing. Cu-doping reduces the resistivity, leads to the red-shift of absorption edge, and narrows \(E_{g}\) of ZnO thin films.
Co-reporter:Yong Liu, Haonan Liu, Yang Yu, Qing Wang, Yinglan Li, Zhi Wang
Materials Letters 2015 Volume 143() pp:319-321
Publication Date(Web):15 March 2015
DOI:10.1016/j.matlet.2014.12.133
Highlights•This work was focused on heavy Cu-doping ZnO films prepared by magnetron co-sputtering.•Moderate Cu-doping can enhance the crystal grain size of the films, but excessive doping can inhabit it.•The fluorescence quenching effect and the red shift phenomenon resulting from Cu-doping are more significant at heavy doping level.•The band gap narrowing effect is more sensitive to doping content in heavily doping region.•A promising band gap reduction of 0.64 eV was achieved at 23.8% doping level.Cu-doping can modulate the properties of ZnO thin films. Most previous researchers studied ZnO:Cu films with moderate doping level, while this work was focused on heavy Cu-doping (13–23.8%) effect on ZnO thin films prepared by magnetron co-sputtering. The microstructure and optical properties of the films were systematically investigated. The results show that moderate Cu-doping enhances the crystal grain size of the films, whereas heavy doping reduces it. The fluorescence quenching effect, the red shift phenomenon and the band gap narrowing effect in emission and absorption characteristics resulting from Cu-doping are more significant at heavy doping level. A promising band gap reduction of 0.64 eV was achieved at 23.8% doping level.
Co-reporter:F. Feng, K. Shi, S.-Z. Xiao, Y.-Y. Zhang, Z.-J. Zhao, Z. Wang, J.-J. Wei, Z. Han
Applied Surface Science 2012 Volume 258(Issue 8) pp:3502-3508
Publication Date(Web):1 February 2012
DOI:10.1016/j.apsusc.2011.11.103

Abstract

In coated conductors, surface roughness of metallic substrates and buffer layers could significantly affect the texture of subsequently deposited buffer layers and the critical current density of superconductor layer. Atomic force microscopy (AFM) is usually utilized to measure surface roughness. However, the roughness values are actually relevant to scan scale. Fractal geometry could be exerted to analyze the scaling performance of surface roughness. In this study, four samples were prepared, which were electro polished Hastelloy C276 substrate, mechanically polished Hastelloy C276 substrate and the amorphous alumina buffer layers deposited on both the substrates by ion beam deposition. The surface roughness, described by root mean squared (RMS) and arithmetic average (Ra) values, was analyzed considering the scan scale of AFM measurements. The surfaces of amorphous alumina layers were found to be fractal in nature because of the scaling performance of roughness, while the surfaces of Hastelloy substrates were not. The flatten modification of AFM images was discussed. And the calculation of surface roughness in smaller parts divided from the whole AFM images was studied, compared with the results of actual AFM measurements of the same scan scales.

Co-reporter:Z. Wang, Z.J. Zhao, B.J. Yan, Y.L. Li, F. Feng, K. Shi, Z. Han
Thin Solid Films 2011 Volume 520(Issue 3) pp:1115-1119
Publication Date(Web):30 November 2011
DOI:10.1016/j.tsf.2011.09.038
A previously found orientation competition in ion beam sputtered yttria-stabilized zirconia thin films was studied in detail. The effects of sputtering energy and deposition angle were analyzed in ion sputtered films without assisting ions bombardment. It is found that for normally deposited films, (001) and (011) orientations are favored at low and high sputtering energy respectively. For inclined substrate deposited films, as deposition angle increases, (001), (011) and (111) orientations are advantaged in turn. The results can be attributed to the in-plane energy exchange of deposition atom and adatoms. In ion beam assisting deposited YSZ films of low assisting ions energy and current, a (001) oriented biaxial texture is gradually induced as ion energy increased. In the case of ion beam assisted inclined deposition of 45°, (001) orientation is enhanced and two preferential in-plane orientations are found coexist.
Co-reporter:Z. Wang, F. Feng, Z.J. Zhao, B.J. Yan, Y.L. Li, Z.T. Jiang, H. Chen, K. Shi, Z. Han
Applied Surface Science 2010 Volume 257(Issue 5) pp:1769-1773
Publication Date(Web):15 December 2010
DOI:10.1016/j.apsusc.2010.09.013

Abstract

Biaxially textured yttria stabilized zirconia (0 0 1) thin films were fabricated on untextured hastelloy substrates by ion beam assisted deposition method. The effects of assisting beam current density Ja and sputtering beam current density Js on the textures of the films were studied. The results indicate that as Ja or Js increase, both the out-of-plane and the in-plane textures are improved initially, and then degrade. The results can be attributed to anisotropic damage and selective sputtering effect of assisting ions. At the same ion-to-atom arrival ratio r, which is reflected with Ja/Js value, lower deposition rate can enhance the biaxial texture.

Co-reporter:Z. Wang, K. Shi, H. Chen, F. Feng, J.C. Sun, Z. Han
Thin Solid Films 2009 Volume 517(Issue 6) pp:2044-2047
Publication Date(Web):30 January 2009
DOI:10.1016/j.tsf.2008.10.071
High quality biaxially textured yttria stabilized zirconia (YSZ) thin films, as buffer layers of coated conductors, were deposited on hastelloy substrates by ion beam assisted deposition (IBAD) method with different assisting ion energy Ei. The roles of assisting ion beam and the influences of ion energy Ei on the structure of the films were studied. It was found that both the out-of-plane alignment and in-plane texture of the IBAD-YSZ films are sensitive to the variation of Ei. The results are explained in the paper by different damage tolerance of the differently oriented grains to ion bombardment.
(R)-7-hydroxy-8,13-dihydroindolo[2',3':3,4]pyrido[2,1-b]quinazolin-5(7H)-one
Goshuyuamide I
6(1H)-Azulenone,2,3,3a,7,8,8a-hexahydro-1,3a-dihydroxy-1,4-dimethyl-7-(1-methylethylidene)-,(1S,3aR,8aR)-
Neocurdione
6(1H)-Azulenone,octahydro-1,4-dihydroxy-1,4-dimethyl-7-(1-methylethylidene)-, (1S,3aR,4R,8aS)-
Bicyclo[4.1.0]heptan-3-one,1-methyl-4-(1-methylethylidene)-7-(3-oxobutyl)-, (1S,6R,7R)-
Zedoarondiol