HF:H₂O₂:H₂O solution (40%wt.HF: 30wt.%H₂O₂: H₂O, 3:2:1 by volume) was used to reveal extended defects (line, face and volume defects) in bulk ZnTe crystals grown from Te solution. The etch patterns were analyzed based on their size, shape and distribution. The etch figures, both in the shape of pits and hillocks with high resolution, show forms controlled by the symmetries of the respective faces were produced. Two different sizes of pits were observed, the larger-size pits correspond to dislocations penetrating the surface, however, the smaller-size texture pits are produced on the defect-free region, which serve as standard pits on respect faces. The face defects, such as grain boundaries, sub-grain boundaries, dislocation walls, twins and stacking faults, can be all displayed clearly. Another essential feature of the etchant is that, it can effectively dissolve Te-rich phase (Te inclusion/precipitates), which makes it promising to reveal the shape of this volume defect.

Large size ZnTe single crystals were grown from Te-solution with the vertical Bridgman method. The fundamental photoreflectance (PR) spectra of bulk ZnTe crystal subjected to a successive sequence of surface treatments, i.e., mechanical and chemical polishing, and passivation, have been measured over the wavelength range 200–600 nm at room temperature (RT) for the first time. The shape, relative intensity and evolution of the distinct E₀, E₁, E₁+∆₁ and E₂ transitions during each stage of wafer processing were investigated. It was found that, those distinct transitions vary with varying crystal surface quality. The intensity of the reflectance peaks is large with sharp peak profile when the surface has good crystalline quality. However, E₀ peak can be easily eliminated by a small amount of structural damages on the wafer surface. The dispersion tendency of the E₁ and E₁+∆₁ peaks suggesting the wafer surface is widespread covered by structural damages. The reflection peaks’ intensity were all reduced after passivated with H₂O₂ solution. E₂ peak intensity is more easily to be reduced during passivation.

A single-chain magnet (SCM) with 1D EO-azide-cobalt chains has been previously synthesized from a solvothermal reaction of Co(NO₃)₂, NaN₃, and 1,4-bis(imidazol-1-yl)benzene (bib). Herein the template HNO₃ is introduced into the above reaction system and another new coordination polymer (1) is obtained, which exhibits an α-Po framework with 1D EE-azide-cobalt chains. The magnetic property of 1 has been well studied, and the results show spin-canted antiferromagnetism and slow relaxation of magnetization.